This page summarizes the changes, enhancements and fixes to the WaferMap Convert V2 program.
WMapConvert v2 now reads TEL P8 binary .dat files. In addition to porting th reader from v1, we can now convert a WA-XX-XXX.dat file without the associated LOT.DAT file. If no LOT.DAT is found in the same directory as the map file, the user can press SCAN and a screen will pop open where the user can enter the wafer diameter, flat location and step size for the device.
If the input map file has only step size (pitch) or only die size, then they will both be set to the same value.UGLY Die
The BinQuality UGLY has been added to the list of known bin qualities and will be used when the input format supports UGLY die.License Fix
In the previous version, the product ID for EM and the product ID for STIF were reversed. This has been fixed.SEMI E-142 Default Layout
Instead of forcing a user to enter a layout name when converting to SEMI E-142, it is set by default to W1. The user can, of course, overwrite this if they so choose.Problem with SECS II Null Bin
When writing to SECS II, the program did not correctly map the null bin. This has been fixed.
Support for Texas Instruments WWF (Worldwide Wafer Format) has been added as an input.WWF Writer Updated
a) WWF writer updated to use a reference device to align the wafer and obtain starting XY indices
b) the MAP_XY section line length restricted to 72 chars. Longer lines were causing some WWF readers to fail.High Resolution Display Support
The user interface dialogs and fields were not displayed correctly on high resolution screens when scaling is applied. This has been corrected.E142 Output Fix
The E142 Parser/Writer handles NullBin information better. Prior versions did not always recognize the null bin definition.SINF Output
When writing SINF, the parameter BCEQU list (good bin codes) is not delimited by a space instead of ","
Added support - input and output - for the binary map format known as SECS II and which is also used by the Electroglas (EG) wafer probers.
Added Unisem input support
A map file submitted by Unisem looks almost identical to the .EM format already supported. The only difference was the header for the flat location. We've updated the parser for EM to also support Unisem input.
WWF Output Added
Support for TI's WWF map format has been added as an output option.
Coordinate Transformation (Rotation)
Some target systems require that the wafer flat be in a particular orientation - typically on the "bottom." The rotation function enables the user to apply rotation in increments of 90 degrees so that incoming data with the flat on one side can be rotated to produce data with the flat on a different side.
SEMI E142 Wafer Attribute = Substrate Type
Added the attribute Substrate Type="Wafer" to the node Substrate Map. Required by customer's E142 import program.
Modified the parsing of the E142 input file to more clearly separate the physical dimensions of the parent or top layout from the child layout.
Added SINF Support
Added support for the SINF wafer map format to both input and output.
Added SEMI E142 Input
A new input format has been added: E142 (XML)
Added 1DIGIT Output
A new output format called 1DIGIT has been added. [Requested by Johnson Electric/Parlex]
Program Flow Revised
The program flow and dialogs have been revised to reflect the user's typical work flow.
This is the initial release of WaferMap Convert V2. It is an entirely new architecture that uses an internal neutral file instead of a direct format to format conversion.
This version requires a separate license for each unique input and output format.
The first release includes:
input formats: .ASY, .EM, .STIF
output formats: SEMI E142 (xml)