web page logo for WmapEdit


Wafer maps are used in the back end of the IC manufacturing process to annotate the die on a wafer - the annotation may indicate whether the die is good or bad, the "grade" of the device or whether this device is a reference device.

WMapEdit (Wafer Map Editor) enables an engineer to view, edit and convert wafer maps from one format to another.

WMapEdit display of a STIF wafer map

Figure 1: WMapEdit displaying a STIF wafer map. The program enables the user to pan and zoom. Placing the cursor over a device provides a readout of the physical location, the array position and the bin code.

WMapEdit control and info windows

Figure 2: A number of windows display information about the map and also enable the user to modify the reference point, modify or add bin codes and assign colors.

Supported Input Formats

SEMI E-142 (XML)









ATT (.A)

TEL P8 Prober (Binary)

Supported Output Formats


SEMI E-142



Other Formats

Formats not currently supported but of future interest ...


Cascade Microtech

Tokyo Seimitsu/Accretch UF3000/PM-90A

Additional input and output formats will be added as our customers request them.



WmapEdit uses the WMapConvert conversion engine for reading and writing map files. When an enhancement is added to WMapConvert, WMapEdit is easily updated to support the new formats.

Pan and Zoom

The user can pan and zoom to examine small sections of the wafer map. This is especially helpful for small die where a single wafer may have 10,000 devices on it.

User Defined Colors

User can set the color of each bin code in order to more clearly display the wafer's yield pattern.

Wafer Outline and Flat/Notch

Even though most map files don't supply a wafer diameter (though some, such as TEL P8, SEMI-E142 and WWF do) the user can enter wafer diameter, flat or notch position and even the size of the flat in order to see how the map fits onto the wafer. Details ...


WmapEdit enables the user to apply a rotational transformation. This is useful when the data is presented with the wafer flat in one orientation but the target machine requires a different orientation.

Bin Code Editing

The user can modify the bin code of any device. Useful when an incoming wafer map does not identify a reference device correctly or when one needs to mark process devices.

Export to Other Formats

The user can import one format and then convert and export to a different format.

Map Synthesizer

Need to generate a map from scratch to exclude edge and ugly die? With the newMap Synthesizer you can generate one in a few seconds and save a lot of programming time on your die bonder.

Glossary of Terms

Various Map formats use different terms for parameters and measurements. Out glossary of terms provides some details on terms used and can help when converting from one format to another.