AIF Import Web page header

Importing AIF Data into Qckvu3

With the AIF import plug-in, a user can import pin geometries defined by an AIF file into Qckvu3 and overlay those geometries against a GDSII file. This plug-in was developed to check netlist (AIF) vs layout for packages with hundreds or thousands of bumps. By running a Boolean operation against the two data sources one identify missing bumps.


Sample Exercise

Suppose we've just completed the layout of a flip chip package. The screen shot below shows the bump openings on the top of our package. We want to verify that there are no missing or extra bumps on our package layout.

top of package layout (GDSII)

As an input to our package design we started with an AIF file of the IC. This file defines the die pad coordinates of the device along with the pin label and net name.


The Import AIF plug-in imports an overlay of the AIF into Qckvu3 enabling the user to check the alignment between package and AIF. Then it will export a new GDSII file with both the package layer and the AIF layer -- plus performs an XOR operation on the two layers to provide a difference layer. By examining the difference layer one can easily find missing or extra bumps/pins and any misalgined pins.

Now we have two layout views

Here's the data flow:

Import AIF data flow

Alignment Problems!

As you can see in the above flow diagram, the two layouts don't align! That means we really can't compare them to find any missing or extra bumps (pins). Why don't they line up?


So, to get this accurate alignment the user will use the View | Transform dialog in Qckvu3 to modify the package layout to match the AIF layout.


Page 1 | 2 | 3