Revision History

This page lists the changes made to StepVu -- enhancements and bug fixes.

Version 1.08 11-26-2024

Added or subtracted half a grid to positive or negative values respectively to accomplish 1nm noise.

Version 1.07 3-23-2024

Updated layer order per customer's request.

Version 1.06 10-23-2023

Removed Cross display from Layer 1 of the output GDSII file.
Prevent duplicate cell names in the output file - Duplicate cell id's stemming from lower case characters will be followed by a digit.

Version 1.05 10-5-2023

This version was compiled with VS2015 for Qckvu3 Windows 64 bit.
Updated boolean components and removed boolean result reports.

Version 1.03 4-16-2013

Fixed a bug when reading the offset values for SINF files. The correct offset is now performed.

Version 1.02c 4-13-2013

Margin was incorrectly scaled. Fixed.

(This is really a qkcvu3 problem but by reducing the text magnitude, Qckvu3 does not get confused about the cell extents.)

Added a count of each die type to the log file

Version 1.02a 4-03-2013

Fixed an error when computing the image offset and size.

Version 1.02 3-29-2013

Added image support with layering in addition to cell outline.

Added ability to draw a user defined margin to show the exclusion zone.

Version 1.01 3-15-2013

Previous version would fail if the SINF input file did not have a value for wafer flat. If this occurs now, the program assumes that the wafer flat=0 and that it is on the bottom of the wafer.

Version 1.00a 1-28-2013

Added support for the SINF file format (used in wafer test)

Version 1.00 1-20-2013

This is the initial release of the Qckvu3/W plug-in version of StepVu and replaces the previous StepVu originally developed in 2003.