SINF Wafer Map Output

The SINF Wafer Map format is used during wafer test to identify good, bad and test die. Various customers for GDS-SR have requested that we produce a SINF output from GDS-SR.

Use the File | Export | SINF pulldown and select SINF Wafer Map ... to open the dialog.

  Export SINF menu pick

A small dialog will appear.

Device - a name for your device

LotA lot number

WaferA wafer ID

  SINF Output Dialog

Then click on OK and enter the name/location of the SINF file you want to create. An example of the output is shown below:

SINF Output

Program Operation:   1 2 3 4 5 6 7 8

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