SINF Wafer Map Output

The SINF Wafer Map format is used during wafer test to identify good, bad and test die. Various customers for GDS-SR have requested that we produce a SINF output from GDS-SR.

Use the File | Export | SINF pulldown and select SINF Wafer Map ... to open the dialog.

A small dialog will appear.

Device - a name for your device

LotA lot number

WaferA wafer ID

Then click on OK and enter the name/location of the SINF file you want to create. An example of the output is shown below: